Non-profit scientific publisher Institute of Physics (IOP) Publishing, UK, has announced a special issue of Measurement Science and Technology. Led by Guest Editors G B Picotto, L Koenders and G Wilkening, the issue provides an overview of current developments in the field of nanoscale metrology. It can be accessed for free until October 31, 2009.
This special issue presents selected contributions from the Nanoscale 2008 seminar held at the Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, in September 2008. The subject matter ranges from new and improved instrumentation, to calibration and correction strategies and also some applications. It is expected that this will be a fundamental resource for all researchers working with measurements at the nanoscale.
A monthly publication, Measurement Science and Technology covers the theory, practice and application of measurement in physics, chemistry, engineering and the environmental and life sciences from inception to commercial exploitation.
