Zeev Zalevsky, dean of Faculty of Engineering at Bar-Ilan University, has been appointed as new editor-in-chief (EIC) of the Journal of Electronic Imaging (JEI), effective January 1, 2021. He succeeds the journal's current editor-in-chief, Karen Egiazarian, who has served since 2016.
Co-published by the Society for Imaging Science and Technology (IS&T) and SPIE, the international society for optics and photonics, JEI covers technology areas that make up the field of electronic imaging and are normally considered in the design, engineering, and applications of electronic imaging systems. It is one of 12 journals published by SPIE in the SPIE Digital Library and one of three IS&T journals.
A Fellow of both IS&T and SPIE — as well as several other professional societies — Zalevsky serves on the SPIE conference program committees for Optical Systems Design, Optical Metrology, Defense and Commercial Sensing, and BiOS. He is also an instructor for the SPIE course ‘Super Resolution and Extended Depth of Focus.’ He received his doctorate in electrical engineering from Tel Aviv University in 1996 and has founded multiple optical startups since then. Zalevsky's areas of research interest include super resolution, the generation and manipulation of light for use in ultra-small applications for high-speed information processing and biological sensing. Through his commercial enterprises, he has developed a next-generation remote biosensor for vital signs, a disposable ultra-thin endoscope, special optical fibers for communication networks and medical diagnosis, and more. In recognition for his research, Zalevsky has received many national and international awards, including the Krill Prize, the International Commission for Optics (ICO) Prize, the Erlangen Graduate School in Advanced Optical Technologies (SAOT) Young Researcher Award, an IS&T Image Engineering Innovation Award, and an SPIE Prism Award.
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